Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

With the move to advanced process technologies, concerns over device power once largely limited to specialized markets have escalated rapidly among mainstream designers. More semiconductor companies ...

Aerospace testing methods reveal hidden risks in complex systems, ensuring reliability in AI-driven designs under real-world ...

Electronics design and testing were once two distinct functions where an electronic design was breadboarded and populated before testing. Problems that emerged during testing may have forced some time ...

Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...

Connected devices and systems have become an integral part of our everyday life and we take this for granted. Finding the fastest way to our destination with a smartphone, reading the news on a tablet ...

Join us on Wednesday, December 15 at noon Pacific for the Design for Test Hack Chat with Duncan Lowder! If your project is at the breadboard phase, or even if you’ve moved to a PCB prototype, it’s ...