In-circuit test (ICT) has been instrumental in identifying manufacturing process defects and component defects on countless varieties of populated printed circuit board (PCB) assemblies for more than ...

Test is becoming increasingly complicated as new technologies such as flexible electronics begin playing mission-critical roles in applications where electronics have little or no history. Although ...

Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...

As the semiconductor industry increasingly moves to chiplets, 2.5D/3D packaging, and heterogeneous integration, there are significant new challenges for test. Leaders like Teradyne have the ...

IEEE today announced IEEE 1149.1-2013 “Standard for Test Access Port and Boundary-Scan Architecture,” which aims to cut costs by means of test reuse from IP to the system level. CJ Clark, Intellitech ...