But perhaps most important is the attention to memory issues in this release. Bun inventor Jared Sumner claims that the ...
An earlier article [“Memory Leak Detection in Embedded Systems”, LJ, September 2002, available at www.linuxjournal.com/article/6059] discussed the detection of ...
Semiconductor IP platform provider Virage Logic has announced its third-generation Self-Test and Repair (STAR) Memory System. The third-generation STAR Memory System provides its predecessor's on-chip ...
Generic test and repair approaches to embedded memory have hit their limit. Smaller feature sizes, such as 130 nm and 90 nm, have made it possible to embed multiple megabits of memory into a single ...
Memory maker Virage Logic (Fremont, Calif.) is debuting a third-generation memory called STAR Memory System (self-test and repair). Although sole-sourcing may or may not be an advantage, the company ...
A condition caused by a program that does not free up the extra memory it allocates. In programming languages, such as C/C++, the programmer can dynamically allocate additional memory to hold data and ...