Abstract: The design of spacers for operation under DC stress is a challenging part for gas-insulated substations (GIS) and gas-insulated transmission lines (GIL). This series of papers has proposed a ...
Abstract: For stacked Nanosheet gate-all-around transistors, a new failure mode between the gate and epitaxial source/drain (PC-Epi) is introduced in the Middle-Of-Line (MOL) intermetal dielectrics ...
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